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Automatic test generation for reference testing

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专利名称:Automatic test generation for reference

testing

发明人:Mark Grechanik,Kevin Michael

Conroy,Matthew Hellige,Edy S.Liongosari,Qing Xie

申请号:US11784121申请日:20070405

公开号:US20080250051A1公开日:20081009

专利附图:

摘要:A system for application reference testing (SMART) solves the technical

problem of generating test data and test cases from graphical user interface applications(GAPs) to test web services, effectively and non-invasively. SMART allows organizations toeasily and promptly identify and resolve software bugs, ensure higher quality softwareand development productivity, complete software projects faster, deliver softwareproducts to market quicker, and improve the return on investment for softwaredevelopment projects. SMART provides a user friendly visualization mechanism thatinteracts with an accessibility layer to enable organizations to economically and easilydefine user interactions with GAPs, by performing point-and-click, drag-and-drop

operations on the GAPs, and generate reusable test data and test cases for web services.

申请人:Mark Grechanik,Kevin Michael Conroy,Matthew Hellige,Edy S. Liongosari,QingXie

地址:Chicago IL US,Evanston IL US,Chicago IL US,Wheeling IL US,Chicago IL US

国籍:US,US,US,US,US

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