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专利名称：Method for calculating and evaluating eddy
current displays, in particular disruptions, ina test object made from a conductivematerial
发明人：JUNGBLUTH, MATTHIAS,
DR.,WILKENHOENER, ROLF, DR.
申请号：EP08009323.0申请日：20080520公开号：EP2124044A1公开日：20091125
专利附图：
摘要：The method involves assigning measuring tracks to each eddy current signals(X1-X5). Processed measuring variables (U1-U5) are provided as a function of the
measuring tracks, frequency and a measuring position (S) along the measuring tracks. Theprocessed measuring variables are interrupted by application of the measuring variablesof adjacent measuring tracks. Synthesized crack signals (V1-V5) are provided with acorrected amplitude and/or track position in relation to the processed measuringvariables.
申请人：SIEMENS AKTIENGESELLSCHAFT
地址：Wittelsbacherplatz 2 80333 München DE
国籍：DE
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